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Lecroy SDA6020 6Ghz QUAD 20GS/s SDA

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Lecroy SDA6020 6Ghz QUAD 20GS/s SDA


 LeCroy SDA6020 Touchscreen 6 Gigahertz Serial Data Analyzer/ Digital Oscilloscope with Quad channel 20 Gigahertz sampling rate (Unlike the SDA6000) is in absolutely beautiful condition. It has been factory calibrated 7/7/2015 and has data. It comes with four LPA-SMA adaptors.


The SDA is the first fully integrated test system designed specifically for evaluating the physical layer characteristics of both optical and electrical serial data signals. The highest fidelity frontend in the industry coupled with LeCroy’s X-Stream Technology provide the foundation for this powerful analysis system that not only conducts Pass/Fail measurements but also traces the fault to the actual bit causing the error. With 20GS/s maximum sampling rate, 6 GHz bandwidth, 1 ps jitter noise floor and long acquisition memory (up to 100M samples) the SDA brings unprecedented analysis capabilities for verifying and testing serial data according to a wide variety of standards.The SDA 6020 with its 20 GS/s sampling rate on all four channels enables multi-lane testing for standards such as PCI-Express and XAUI. Locate Mask Violations Down to the Bit Eye patterns are measured by using a continuous acquisition of up to 8 million bits of the input data stream and uses a numerical PLL to recover a reference clock from the captured waveform. This method completely eliminates trigger jitter to produce the ‘cleanest’ eye patterns. In fact, the SDA generates only 6 ps of peak to peak jitter which is 7x cleaner than similar clock recovery instruments. The original bit sequence is stored along with the eye pattern allowing the user to locate the exact bit or bits that caused a mask failure. This type of analysis can directly indicate the source of mask failures, speeding up the debugging process.
Comprehensive Jitter Analysis Characterizing jitter is critical to the measurement of serial data signals. The SDA is the most complete jitter measurement instrument in the industry, capable of measuring a full set of clock and timing jitter parameters as well as time interval error (TIE) measurements for serial data signals. The TIE measurements are performed using a numerical phase locked loop derived from the data waveform as the reference clock. Jitter measurements include total jitter, random and deterministic jitter. Deterministic jitter is also broken down into its components of periodic jitter and data dependent jitter. A powerful, patent-pending algorithm evaluates data dependent jitter and shows a direct view of the eye pattern showing only the affects of data dependent jitter. The contribution of individual bit patterns can be viewed allowing the analysis of specific data-dependent problems.

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