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Oxford Instruments X-Strata 980 Coating Thickness Analyzer

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Product Description

Oxford Instruments X-Strata 980 Coating Thickness Analyzer




  • ·         XRF for analysis of trace elements and coating thickness
  • ·         Non-destructive fast analysis of precious metals, multi-layer coating thickness, and elemental composition for a wide range of materials
  • ·         Thickness measurement up to 5 layers, 15 elements, and common elements correction
  • ·         Simultaneous composition analysis up to 25 elements
  • ·         Simultaneous analysis of both thickness and composition
  • ·         SmartLink Fundamental Parameters software
  • ·         Measurement methods according to ISO 3497, ASTM B568, DIN 50987 and IEC 62321
  • ·         Large chamber to accommodate large samples
  • ·         Closed chamber design for radiation protection and added safety
  • ·         Highly sensitive 100 W X-ray tube
  • ·         High resolution, Peltier-cooled silicon PIN detector
  • ·         Multiple collimators
  • ·         Low-background measurement plate
  • ·         Real time data exportation
  • ·         Fundamental parameters methods for ease of instrument calibration
  • ·         Rugged overall design for easy, safe operation in any industrial setting
  • ·         Ideal for use on electronics or metals
  • ·         RoHS/WEEE/ELV compliance testing
  • ·         Determines amount of hazardous materials
  • ·         Quantification of toxic elements
  • ·         Metal alloy composition and identifications without destroying or compromising the metal
  • ·         Composition analysis of the thin-film absorber layer in thin-film photovoltaic cells
  • ·         Optimized electrical conductivity through layer thickness analysis

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